Skip to main content

Test

Testing

 

Surface and Thin Film Measurement

  • Tencor Stylus profilometer
  • Talysurf white light interferometer (1nm resolution in z axis)
  • Nanometrics thickness measurement
  • Scanning Electron Microscope

 

Electrical characterisation:

  • CV
  • IV
  • Wentworth probe station and cold station.(-200C to 250C).