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In This Section
  • TESCAN LYRA3
  • TALOS F200X G2
  • Atomic Force Microscope (AFM)
  • JEOL JSM-6500F
  • X-ray diffraction (XRD)

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  • School of Mathematics and Physics
  • Research
  • Ewald Microscopy Facilities
  • Facilities
  • Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

AFM-2

Atomic Force Microscope (AFM): MFP-3D infinity

Features:

  • Capable of atomic resolution imaging of calcite in water and high-resolution topography mapping of large areas
  • Fully equipped electrical characterisation modes: KPFM, EFM, Conductive AFM, PFM, SSRM etc.
  • In-plane variable Magnetic field (-0.8 to 0.8 T), Compatible with other imaging modes
  • Sample heater for variable temperature imaging (25-400°C)
  • Scanning Thermal Microscopy (up to 160°C)
  • Lithography, Magnetic force microscopy with unprecedented resolutions
  • High Voltage option up to +/- 150V

Applications:

  • Most advanced surface topography mapping with excellent resolution
  • Wide range of simultaneous functional imaging modes for samples
  • Nanoscale electrical and magnetic characterisation with variable fields (especially relevant for memory applications)
  • Investigating glass transitions and softening in polymers
  • Nanoscale mechanical characterization (force mapping) for evaluating modulus and adhesion
  • Nanoscale characterization of energy related materials (fuel cells and batteries) and 2D materials
  • Lithography, nanomanipulation and nanoindentation
  • High resolution conduction mapping
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Facilities
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  • TESCAN LYRA3
  • TALOS F200X G2
  • Atomic Force Microscope (AFM)
  • JEOL JSM-6500F
  • X-ray diffraction (XRD)
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School of Mathematics and Physics

Main Physics Building
University Road
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BT7 1NN

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E-mail: mp@qub.ac.uk

Telephone: +44 (0)28 9097 1386/5293

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