TALOS F200X G2
TALOS F200X G2: Scanning/ transmission electron microscope (S/TEM)
FEI Talos combines high-resolution S/TEM and TEM imaging with energy dispersive x-ray spectroscopy (EDX) for chemical characterization with composition mapping.
- EDX system for chemical analysis: ≤136 eV for Mn-Kα
- Fast detector camera: 4k × 4k movies at 1 fps or 512 × 512 movies at 25fps.
- TEM information limit: ~0.12 nm
- STEM resolution: ~0.16 nm
- 80 and 200 kV settings (for beam sensitive samples)
- Single tilt Heating/biasing holder (up to 1000°C)
- Chemical analysis and elemental distribution: alloys, catalyst, ceramics, etc.
- Structural analysis: grain structure, crystallographic information, metrology, failure analysis, etc.