JEOL JSM-6500F

Field-emission gun Scanning electron microscope (FEG-SEM) that allows a wide range of specimens to be examined, including uncoated samples.

Features:

• Acceleration Voltage: 1 ~ 30 kV
• The analysis facilities include EDX (Oxford Inca system), WDS and cathodoluminescence (Gatan MiniCL, visible range, 185 nm ‐ 850 nm)

Applications:

• Surface and morphology examination
• Chemical analysis of bulk samples.
• Cathodoluminescence analysis