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In This Section
  • TESCAN LYRA3
  • TALOS F200X G2
  • Atomic Force Microscope (AFM)
  • JEOL JSM-6500F
  • X-ray diffraction (XRD)

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  • Ewald Microscopy Facilities
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  • JEOL JSM-6500F

JEOL JSM-6500F

SEM-2

JEOL JSM-6500F

Field-emission gun Scanning electron microscope (FEG-SEM) that allows a wide range of specimens to be examined, including uncoated samples.

Features:

  • Acceleration Voltage: 1 ~ 30 kV
  • The analysis facilities include EDX (Oxford Inca system), WDS and cathodoluminescence (Gatan MiniCL, visible range, 185 nm ‐ 850 nm)

Applications:

  • Surface and morphology examination
  • Chemical analysis of bulk samples.
  • Cathodoluminescence analysis
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Facilities
  • Facilities
  • TESCAN LYRA3
  • TALOS F200X G2
  • Atomic Force Microscope (AFM)
  • JEOL JSM-6500F
  • X-ray diffraction (XRD)
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School of Mathematics and Physics

Main Physics Building
University Road
Belfast
BT7 1NN

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General School Enquiries:

E-mail: mp@qub.ac.uk

Telephone: +44 (0)28 9097 1386/5293

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