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In This Section
  • TESCAN LYRA3
  • TALOS F200X G2
  • Atomic Force Microscope (AFM)
  • JEOL JSM-6500F
  • X-ray diffraction (XRD)

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  • X-ray diffraction (XRD)

X-ray diffraction (XRD)

XRD-2

X-ray diffraction (XRD)

An easy-to-use XRD system for all materials research analytical techniques, suitable for thin films and powders.  It uses a Cu-Ka micro x-ray source with Montel mirror.

Applications:

  • Reflectometry
  • High resolution diffraction
  • Phase identification
  • Residual stress and texture studies
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Facilities
  • Facilities
  • TESCAN LYRA3
  • TALOS F200X G2
  • Atomic Force Microscope (AFM)
  • JEOL JSM-6500F
  • X-ray diffraction (XRD)
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School of Mathematics and Physics

Main Physics Building
University Road
Belfast
BT7 1NN

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General School Enquiries:

E-mail: mp@qub.ac.uk

Telephone: +44 (0)28 9097 1386/5293

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